Student Colloquium
DATE	2019-10-08　12:00-13:00
PLACE	數學館3176教室
SPEAKER	王翔寬 同學（成功大學數學系）
TITLE	Step-Stress Accelerated Degradation Test Modeling and Data Analysis for LED Data.
ABSTRACT	Degradation models are widely used to assess the lifetime information of highly reliable products if there exists quality characteristics whose degradation over time can be related to reliability. To reduce cost and time of experiment, we will introduce the SSADT. SSADT not only reduces the experimental cost significantly, but also provides the reliability analysts an efficient tool to assess the lifetime distribution of highly reliable products. 我要參加